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| U816BS-SP 1.1-GHz Prescaler for TV Tuners Technology: Bipolar Features D Extrem low current consumption (typ. 17 mA) D Output harmonics strongly reduced D Scaling factor: 256 D High input sensitivity D ECL output stage D Electrostatic protection according to MIL-STD. 883 Case: 6-pin single-inline plastic Absolute Maximum Ratings Reference point Pin l, unless otherwise specified Parameters Supply voltage Input voltage range Junction temperature Ambient-temperature range Storage-temperature range Pin 4 Pins 5 and 6 Symbol VS Vi Tj Tamb Tstg Value 6 0 to VS 125 -25 to +85 -40 to +125 Unit V V C C C Thermal Resistance Parameters Junction ambient Symbol RthJA Maximum 100 Unit K/W TELEFUNKEN Semiconductors Rev. A1, 05-Sep-96 1 (5) U816BS-SP Figure 1. Block diagram Pin Configuration Pin 1 2, 3 Function Ground Output Pin 4 5, 6 Function VS Input Electrical Characteristics VS = 4.5 to 5.5 V, Tamb = 0 to 70 _C, referred to test circuit, unless otherwise specified Parameters Supply-voltage range Supply current Input sensitivity 1) Test Conditions / Pin Pin 4 VS = 5 V Pin 4 RG = 50 W fi = 70 to 1000 MHz Pin 5, 6 fi = 1000 to 1100 MHz Pin 5, 6 fi = 1100 to 1200 MHz Pin 5, 6 RG = 50 W Pin 5, 6 Symbol VS IS Min 4.5 Typ 17 Max 5.5 21 Unit V mA vi vi vi Vi fimin fimax 10 15 40 300 70 1200 mV mV mV mV MHz MHz Large-signal compatibility Frequency range Output stage Balanced ECL output Voltage swing each output Output impedance 1) fi 1000 MHz CL = 13 pF. SF = 1:256 Pin 2, 3 Pin 2, 3 VO ZO 0.6 500 1.2 Vpp W RMS voltage calculated from the available power measured 2 (5) TELEFUNKEN Semiconductors Rev. A1, 05-Sep-96 U816BS-SP Figure 2. Test circuit Figure 3. Output circuit (ECL output) TELEFUNKEN Semiconductors Rev. A1, 05-Sep-96 3 (5) U816BS-SP Figure 4. Input sensitivity Dimensions in mm Package: SIP6 4 (5) TELEFUNKEN Semiconductors Rev. A1, 05-Sep-96 U816BS-SP Ozone Depleting Substances Policy Statement It is the policy of TEMIC TELEFUNKEN microelectronic GmbH to 1. Meet all present and future national and international statutory requirements. 2. Regularly and continuously improve the performance of our products, processes, distribution and operating systems with respect to their impact on the health and safety of our employees and the public, as well as their impact on the environment. It is particular concern to control or eliminate releases of those substances into the atmosphere which are known as ozone depleting substances ( ODSs). The Montreal Protocol ( 1987) and its London Amendments ( 1990) intend to severely restrict the use of ODSs and forbid their use within the next ten years. Various national and international initiatives are pressing for an earlier ban on these substances. TEMIC TELEFUNKEN microelectronic GmbH semiconductor division has been able to use its policy of continuous improvements to eliminate the use of ODSs listed in the following documents. 1. Annex A, B and list of transitional substances of the Montreal Protocol and the London Amendments respectively 2 . Class I and II ozone depleting substances in the Clean Air Act Amendments of 1990 by the Environmental Protection Agency ( EPA) in the USA 3. Council Decision 88/540/EEC and 91/690/EEC Annex A, B and C ( transitional substances ) respectively. TEMIC can certify that our semiconductors are not manufactured with ozone depleting substances and do not contain such substances. We reserve the right to make changes to improve technical design and may do so without further notice. Parameters can vary in different applications. All operating parameters must be validated for each customer application by the customer. Should the buyer use TEMIC products for any unintended or unauthorized application, the buyer shall indemnify TEMIC against all claims, costs, damages, and expenses, arising out of, directly or indirectly, any claim of personal damage, injury or death associated with such unintended or unauthorized use. TEMIC TELEFUNKEN microelectronic GmbH, P.O.B. 3535, D-74025 Heilbronn, Germany Telephone: 49 ( 0 ) 7131 67 2831, Fax number: 49 ( 0 ) 7131 67 2423 TELEFUNKEN Semiconductors Rev. A1, 05-Sep-96 5 (5) |
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